X-ray based tools for the investigation of buried interfaces in organic electronic devices
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15 صفحه اولCombining non-specular X-ray scattering and X-ray absorption spectroscopy for the investigation of buried layers
The atomic structure and the chemical composition of buried interfaces is of high interest for many applications e.g. in multilayered samples such as oxidized metals, optic or microelectronic devices. Conventional surface analytical techniques such as X-ray photoelectron spectroscopy (XPS), Auger-electron spectroscopy (AES) or ion scattering spectroscopy (ISS) have an extremely high surface sen...
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ژورنال
عنوان ژورنال: Organic Electronics
سال: 2013
ISSN: 1566-1199
DOI: 10.1016/j.orgel.2012.11.016